ICSPI – Redux AFM
Effortlessly collect 3D topography data with sub-nanometer precision on your benchtop with the Redux AFM. Get quantitative data in minutes for topography, roughness, film thickness, particle size and more.
Revolutionary AFM-on-a-Chip Technology Simplifies Traditional AFM Processes
Traditional AFM instruments, while powerful for nanoscale surface imaging, are often hindered by complex and time-consuming setup processes rooted in technology developed in the 1980s. Recognizing this challenge, ICSPI revolutionized the landscape with its unique AFM-on-a-chip technology. The Redux AFM, harnessing this breakthrough technology, makes nanoscale imaging effortless. By integrating multiple components onto a single chip, the Redux eliminates the cumbersome aspects of traditional AFM, such as silicon probe exchange, cantilever alignment, tip crashes, tip-sample approach, and controller tuning.
Technical Specifications
| AFM Specifications | |
| Sensing | Self-sensing, laser alignment-free |
| Z actuation | Self-actuating |
| XY actuation | Electrothermal |
| Max scan area (XY) | 20 μm x 20 μm |
| Z Range | 20 μm |
| Sample | |
| Max sample height | 20 mm |
| Max sample weight | 250 g |
| Integrated Optical Microscope | |
| Objective | 10x, 0.25 NA |
| Field of view | 1.4 mm × 0.8 mm |
| Resolution | 1920 x 1080 FHD video output |
| System Dimensions | |
| Dimensions (L x W x H) | 23.2 cm × 22.0 cm × 24.6 cm |
| Weight | 4 kg |
| Software and I/O | |
| Communication | USB |
| Operating System | Windows 10, 11 |
| Power | |
| Power supply | Class II (two prong) |
| Input | 100-240 VAC ~ 50/60 Hz |
| Output | 12 VDC, 3 A |
Key Features
- Precise: Quantitative 3D data with sub-nanometer precision
- Automated: Motorized X, Y and Z stages for easy sample navigation
- High throughput: Go from sample loading to data in minutes
- Versatile: Topography, roughness, thickness, particle size and more
Automated
- One-click configuration
- One-click automatic approach in seconds
- Laser alignment-free operation
Unlike traditional AFMs, the Redux has no laser alignment step or manual approach: an integrated sensor on the AFM chip automates everything for you.
Compatible with your sample
- Opaque or transparent, conductive or non-conductive samples
- Minimal to no sample preparation and non-destructive scanning
- Generous sample platform (125 mm x 100 mm) and height (20 mm)
The Redux is compatible with virtually any solid sample, including adhesive samples.
Ultra-durable probes
- Extremely low tapping force
- Easy handling
- Laser alignment-free operation
Our unique AFM chips have durable probes that last hundreds of scans without noticeable wear. The AFM chips are mounted onto easy-to-handle printed circuit boards (PCBs) that can even be handled by hand.
Solutions
Redux AFM: Automated Atomic Force Microscope
Brand
ICSPI develops and produces easy to use and affordable benchtop AFM instruments designed for the individual scientist and individual lab to capture 3D images at the nanoscale. Incorporating our AFM-on-a-Chip technology, our flagship instrument, the nGauge AFM provides researchers and scientists 3D scans at the nanoscale in about a minute in their own lab and on their own bench. ICSPI is headquartered in Kitchener-Waterloo, Ontario, Canada.