Bettersize – Dynamic Image Particle Analyser with Wet Dispersion – BeVision W1
BeVision W1 is a high-resolution dynamic image particle size and particle shape analyzer. Based on sheath flow theory, BeVision W1 particle size distribution analyser can capture each particle and deliver accurate image data. BeVision W1 particle analyzer is the best solution for scientific research and quality control.
Technical Specifications
Size Range | 4-400 µm |
Repeatability error | ≤1% (CRM D50) |
Accuracy error | ≤1% (CRM D50) |
Magnifying times | 150-1000 times |
Voltage | AC 220V 、50/60Hz |
Volume、weight | 610x300x450mm、22KG |
Imported high speed CCD | 120 frm/s |
Special technologies | Sheath flow technology;Multithreading and edge recognition technology |
Particle recognition speed | ≥10000 particles /min |
Analytical items | (1) particle size distribution; typical data;maximum particle size;specific interval content;the particle size content more than or less than certain particle size. (2) particle shape: aspect ratio and aspect ratio distribution; circularity and circularity distribution; particle image. (3) particle count:To measure the number of particles in a certain volume of liquid. |
Export items | including the original parameter (including the sample information, testing information,etc), analytical data (including the particle size distribution, aspect ratio, circularity and typical data,etc.), distribution graph (interval distribution histogram and cumulative distribution curve,etc.) |
Key Features
BeVision W1
- Measurement: Particle shape, particle size
- Particle size range: 4 to 400µm
- Dispersion type: Wet
- Technology: Automated Imaging
Key Features
- Analysis parameters: Particle size distribution, D100, aspect ratio, circularity and radius-thickness ratio.
- Optimized software: Identify 10,000 particles per minute. Automatic recognition of agglomerated powder further improves accuracy.
- Sheath flow theory: Ensures each individual particle passes through the focal plane of the cell sequentially, eliminates particle overlapping and defocus issues.

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